Elham Cheshmikhani
Orcid: 0000-0003-3737-683X
According to our database1,
Elham Cheshmikhani
authored at least 15 papers
between 2015 and 2024.
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Bibliography
2024
IEEE Trans. Circuits Syst. II Express Briefs, August, 2024
2023
2022
CoPA: Cold Page Awakening to Overcome Retention Failures in STT-MRAM Based I/O Buffers.
IEEE Trans. Parallel Distributed Syst., 2022
3RSeT: Read Disturbance Rate Reduction in STT-MRAM Caches by Selective Tag Comparison.
IEEE Trans. Computers, 2022
IEEE Access, 2022
2020
A System-Level Framework for Analytical and Empirical Reliability Exploration of STT-MRAM Caches.
IEEE Trans. Reliab., 2020
STAIR: High Reliable STT-MRAM Aware Multi-Level I/O Cache Architecture by Adaptive ECC Allocation.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
A-CACHE: Alternating Cache Allocation to Conduct Higher Endurance in NVM-Based Caches.
IEEE Trans. Circuits Syst. II Express Briefs, 2019
IEEE Trans. Computers, 2019
Enhancing Reliability of STT-MRAM Caches by Eliminating Read Disturbance Accumulation.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
ROBIN: incremental oblique interleaved ECC for reliability improvement in STT-MRAM caches.
Proceedings of the 24th Asia and South Pacific Design Automation Conference, 2019
2017
Fast Fault Tree Analysis for Hybrid Uncertainties Using Stochastic Logic Implemented on Field-Programmable Gate Arrays: An Application in Quantitative Assessment and mitigation of Welding Defects Risk.
Qual. Reliab. Eng. Int., 2017
2016
Proceedings of the 24th Euromicro International Conference on Parallel, 2016
Investigating the Effects of Process Variations and System Workloads on Reliability of STT-RAM Caches.
Proceedings of the 12th European Dependable Computing Conference, 2016
2015
Probabilistic analysis of dynamic and temporal fault trees using accurate stochastic logic gates.
Microelectron. Reliab., 2015