Elena Castilla

Orcid: 0000-0002-9626-6449

According to our database1, Elena Castilla authored at least 18 papers between 2018 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing.
Qual. Reliab. Eng. Int., June, 2024

Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks.
J. Comput. Appl. Math., February, 2024

2023
Robust Minimum Divergence Estimation for the Multinomial Circular Logistic Regression Model.
Entropy, October, 2023

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes.
Qual. Reliab. Eng. Int., June, 2023

Power divergence approach for one-shot device testing under competing risks.
J. Comput. Appl. Math., 2023

2022
Estimation and Testing on Independent Not Identically Distributed Observations Based on Rényi's Pseudodistances.
IEEE Trans. Inf. Theory, 2022

A New Robust Approach for Multinomial Logistic Regression With Complex Design Model.
IEEE Trans. Inf. Theory, 2022

Robust approach for comparing two dependent normal populations through Wald-type tests based on Rényi's pseudodistance estimators.
Stat. Comput., 2022

Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis.
Qual. Reliab. Eng. Int., 2022

EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan.
Qual. Reliab. Eng. Int., 2022

On distance-type Gaussian estimation.
J. Multivar. Anal., 2022

2021
Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test.
IEEE Trans. Reliab., 2021

Robust semiparametric inference for polytomous logistic regression with complex survey design.
Adv. Data Anal. Classif., 2021

2020
Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model.
IEEE Trans. Reliab., 2020

Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses.
Qual. Reliab. Eng. Int., 2020

Model Selection in a Composite Likelihood Framework Based on Density Power Divergence.
Entropy, 2020

2019
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution.
IEEE Trans. Inf. Theory, 2019

2018
Composite Likelihood Methods Based on Minimum Density Power Divergence Estimator.
Entropy, 2018


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