Ekaterina Nikolaeva

According to our database, Ekaterina Nikolaeva authored at least 9 papers between 2007 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Constructing a Sequence Detecting Robustly Testable Path Delay Faults in Sequential Circuits.

Anzhela Yu. Matrosova, Semen Chernyshov, O. Kh. Kim, Ekaterina Nikolaeva

Autom. Remote. Control., 2021

2019

Masking Internal Node Faults and Trojan Circuits in Logical Circuits.

Anzhela Yu. Matrosova, V. Provkin, Ekaterina Nikolaeva

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2017

Detection and masking of Trojan Circuits in sequential logic.

Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Sergey Ostanin, Ekaterina Nikolaeva

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

A fault-tolerant sequential circuit design for SAFs and PDFs soft errors.

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, Ekaterina Nikolaeva

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015

Fault-tolerant high performance scheme design.

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, Ekaterina Nikolaeva

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014

Combinational circuits without false paths.

Anzhela Yu. Matrosova, Dmitry Kudin, Ekaterina Nikolaeva

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

PDF testability of the circuits derived by special covering ROBDDs with gates.

Anzhela Yu. Matrosova, Ekaterina Nikolaeva, Dmitry Kudin, Virendra Singh

Proceedings of the East-West Design & Test Symposium, 2013

2010

PDFs testing of combinational circuits based on covering ROBDDs.

Anjela Yu. Matrosova, Ekaterina Nikolaeva

Proceedings of the 2010 East-West Design & Test Symposium, 2010

2007

Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs.

Anjela Yu. Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikolaeva

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007