Ekaniyere Oko-Odion

According to our database, Ekaniyere Oko-Odion authored at least 6 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm.

Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.

Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities.

Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

2023

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.

Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen

IEEE Des. Test, October, 2023

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.

Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.

Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023