Eishi Ibe
According to our database1,
Eishi Ibe
authored at least 4 papers
between 2003 and 2012.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2008, "For contributions to neutron-induced soft-error analysis for semiconductor memory devices".
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2012
Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons.
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012
2006
Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006
2005
Proceedings of the Third International Conference on Information Technology and Applications (ICITA 2005), 2005
2003
16.7-fA/cell tunnel-leakage-suppressed 16-Mb SRAM for handling cosmic-ray-induced multierrors.
IEEE J. Solid State Circuits, 2003