Ehrenfried Seebacher

According to our database, Ehrenfried Seebacher authored at least 7 papers between 2008 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits.

Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti, Nezam Rohbani, C. Ma, Hans Jürgen Mattausch, A. Schiffmann, Alexander Steinmair, Ehrenfried Seebacher

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016

Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology.

Hao Zou, Yasser Moursy, Ramy Iskander, Alexander Steinmair, Heimo Gensinger, Ehrenfried Seebacher, Jean-Paul Chaput, Marie-Minerve Louërat

IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Analysis of substrate currents propagation in HVCMOS technology.

Camillo Stefanucci, Pietro Buccella, Ehrenfried Seebacher, Alexander Steinmair, Maher Kayal, Jean-Michel Sallese

Proceedings of the 46th European Solid-State Device Research Conference, 2016

Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs.

Yasser Moursy, Hao Zou, Ramy Iskander, Pierre Tisserand, Dieu-My Ton, Giuseppe Pasetti, Ehrenfried Seebacher, Alexander Steinmair, Thomas Gneiting, Heidrun Alius

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2011

An analytical approach for physical modeling of hot-carrier induced degradation.

Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser

Microelectron. Reliab., 2011

2010

Interface traps density-of-states as a vital component for hot-carrier degradation modeling.

Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser

Microelectron. Reliab., 2010

2008

Scalable High Voltage CMOS technology for Smart Power and sensor applications.

Martin Schrems, Martin Knaipp, Hubert Enichlmair, Verena Vescoli, Rainer Minixhofer, Ehrenfried Seebacher, Friedrich Peter Leisenberger, Ewald Wachmann, Gregor Schatzberger, Heimo Gensinger

Elektrotech. Informationstechnik, 2008