Eduardo Ortega

According to our database, Eduardo Ortega authored at least 9 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

TaintLock: Hardware IP Protection Against Oracle-Guided and Oracle-Reconstruction Attacks.

Jonti Talukdar, Arjun Chaudhuri, Eduardo Ortega, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2025

Discretized-Isolation Forest: Memory- and Compute-Efficient Unsupervised Anomaly Detection for Resource-Constrained Internet of Things Edge Devices.

Eduardo Ortega, Fei Su, Rita Chattopadhyay, Krishnendu Chakrabarty

IEEE Internet Things J., January, 2025

2024

ALT-Lock: Logic and Timing Ambiguity-Based IP Obfuscation Against Reverse Engineering.

Jonti Talukdar, Woohyun Paik, Eduardo Ortega, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., August, 2024

Rowhammer Vulnerability of DRAMs in 3-D Integration.

Eduardo Ortega, Jonti Talukdar, Woohyun Paik, Tyler K. Bletsch, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., May, 2024

Enhancing efficiency in spaceborne phased array systems: MVDR algorithm and FPGA integration.

Eduardo Ortega, Alejandro Vicente, Agustín Martínez-Hellín, Óscar Rodríguez, Manuel Prieto, Pablo Parra, Antonio da Silva, Sebastián Sánchez

Digit. Signal Process., 2024

Do Counterfactual Examples Complicate Adversarial Training?

Eric C. Yeats, Cameron Darwin, Eduardo Ortega, Frank Liu, Hai Li

CoRR, 2024

E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry.

Eduardo Ortega, Jonti Talukdar, Woohyun Paik, Fei Su, Rita Chattopadhyay, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2024

2023

Efficiency and Vulnerability in Networks: A Game Theoretical Approach.

Conrado Miguel Manuel, Eduardo Ortega

Axioms, December, 2023

Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation.

Eduardo Ortega, Tyler K. Bletsch, Biresh Kumar Joardar, Jonti Talukdar, Woohyun Paik, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2023