Eduardo Aldrete-Vidrio

According to our database, Eduardo Aldrete-Vidrio authored at least 8 papers between 2006 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.

Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2011

Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.

Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez

IEEE Trans. Circuits Syst. I Regul. Pap., 2011

Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.

Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez

J. Electron. Test., 2011

2010

Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.

Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2009

Non-invasive RF built-in testing using on-chip temperature sensors.

Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.

Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire

Proceedings of the 13th European Test Symposium, 2008

2007

Electrical characterization of analogue and RF integrated circuits by thermal measurements.

Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio

Microelectron. J., 2007

2006

Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.

Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006