Edmundo A. Gutiérrez-D.

Orcid: 0000-0002-3015-8736

According to our database1, Edmundo A. Gutiérrez-D. authored at least 4 papers between 2014 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2014
Influence of the surface roughness of the bottom electrode on the resistive-switching characteristics of Al/Al<sub>2</sub>O<sub>3</sub>/Al and Al/Al<sub>2</sub>O<sub>3</sub>/W structures fabricated on glass at 300 °C.
Microelectron. Reliab., 2014

Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs.
Proceedings of the 44th European Solid State Device Research Conference, 2014


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