Edmundo A. Gutiérrez-D.
Orcid: 0000-0002-3015-8736
According to our database1,
Edmundo A. Gutiérrez-D.
authored at least 4 papers
between 2014 and 2024.
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Bibliography
2024
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2014
Influence of the surface roughness of the bottom electrode on the resistive-switching characteristics of Al/Al<sub>2</sub>O<sub>3</sub>/Al and Al/Al<sub>2</sub>O<sub>3</sub>/W structures fabricated on glass at 300 °C.
Microelectron. Reliab., 2014
Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs.
Proceedings of the 44th European Solid State Device Research Conference, 2014