E. Vincent
According to our database1,
E. Vincent
authored at least 20 papers
between 2001 and 2021.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2021
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2018
Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors.
Microelectron. Reliab., 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2010
Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation.
Microelectron. Reliab., 2010
2007
Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements.
Microelectron. Reliab., 2007
2006
2005
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs.
Microelectron. Reliab., 2005
2004
Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides.
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies.
Microelectron. Reliab., 2003
2002
Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement.
Microelectron. Reliab., 2002
2001
Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions.
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001
Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs.
Microelectron. Reliab., 2001