E. R. Heller

According to our database, E. R. Heller authored at least 4 papers between 2008 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2016

Evidence for causality between GaN RF HEMT degradation and the E_C-0.57 eV trap in GaN.

Aaron R. Arehart, A. Sasikumar, Glen David Via, Brian S. Poling, E. R. Heller, S. A. Ringel

Microelectron. Reliab., 2016

2015

Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps.

A. Sasikumar, Aaron R. Arehart, Glen David Via, B. Winningham, Brian S. Poling, E. R. Heller, S. A. Ringel

Microelectron. Reliab., 2015

Performance of commercial foundry-level AlGaN/GaN HEMTs after hot electron stressing.

Brian S. Poling, J. L. Brown, E. R. Heller, B. Stumpff, J. A. Beckman, A. M. Hilton

Microelectron. Reliab., 2015

2008

Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects.

E. R. Heller, A. Crespo

Microelectron. Reliab., 2008