E. Liniger

According to our database, E. Liniger authored at least 3 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics.

J. R. Lloyd, C. E. Murray, S. Ponoth, S. Cohen, E. Liniger

Microelectron. Reliab., 2006

2004

Reliability Challenges with Ultra-Low k Interlevel Dielectrics.

J. R. Lloyd, M. R. Lane, X.-H. Liu, E. Liniger, T. M. Shaw, C.-K. Hu, R. Rosenberg

Microelectron. Reliab., 2004

Time dependent dielectric breakdown in a low-k interlevel dielectric.

J. R. Lloyd, E. Liniger, S. T. Chen

Microelectron. Reliab., 2004