E. K. Lai

According to our database, E. K. Lai authored at least 5 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A Novel Chalcogenide Based CuGeSe Selector Only Memory (SOM) for 3D Xpoint and 3D Vertical Memory Applications.

Wei-Chih Chien, J. X. Zheng, C. W. Yeh, Lynne M. Gignac, H. Y. Cheng, Z. L. Liu, Alexander Grun, C. L. Sung, E. K. Lai, S. Cheng, C. W. Cheng, L. Buzi, A. Ray, Douglas M. Bishop, Robert L. Bruce, M. J. BrightSky, H. L. Lung

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

AsSeGeS and GeN Heterostructures for Superior OTS Performance.

Alexander Grun, Z. L. Lui, C. W. Cheng, D. Piatek, E. K. Lai, Y. T. Kuo, Wei-Chih Chien, S. Cheng, M. J. BrightSky, H. L. Lung, Huai-Yu Cheng

Proceedings of the IEEE International Memory Workshop, 2024

A Novel Program-verify Free and Low Drift Multilevel Operation on Cross-point OTS-PCM for In-Memory Computing Application.

Wei-Chih Chien, C. L. Sung, Robert L. Bruce, C. W. Yeh, Huai-Yu Cheng, Z. L. Liu, E. K. Lai, C. W. Cheng, J. X. Zheng, Alexander Grun, A. Ray, D. Daudelin, H. Y. Ho, Matthew BrightSky, H. L. Lung

Proceedings of the IEEE International Memory Workshop, 2024

2023

A Comprehensive Study on the Pillar Size of OTS-PCM Memory with an Optimized Process and Scaling Trends Down to Sub-10 nm for SCM Applications.

Wei-Chih Chien, E. K. Lai, L. Buzi, C. W. Cheng, C. W. Yeh, A. Ray, Lynne M. Gignac, N. Gong, Huai-Yu Cheng, Alexander Grun, D. Y. Lee, W. Kim, A. Majumdar, Douglas M. Bishop, Robert L. Bruce, D. Daudelin, H. Y. Ho, M. J. BrightSky, H. L. Lung

Proceedings of the IEEE International Memory Workshop, 2023

2022

Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme.

Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, Chia-Sheng Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung

Proceedings of the IEEE International Reliability Physics Symposium, 2022