E. Ehrichs

According to our database, E. Ehrichs authored at least 2 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2006

Process Window and Device Variations Evaluation using Array-Based Characterization Circuits.

C. Tabery, M. Craig, Gert Burbach, B. Wagner, S. McGowan, P. Etter, S. Roling, C. Haidinyak, E. Ehrichs

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2004

Opportunities and challenges in asymmetric device implementation [CMOS device scaling].

J. F. Buller, R. van Bentum, J. Cheek, E. Ehrichs, M. Horstmann, S. Searles

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004