E. Andries

According to our database1, E. Andries authored at least 2 papers in 2002.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2002
High-resolution SILC measurements of thin SiO<sub>2</sub> at ultra low voltages.
Microelectron. Reliab., 2002

Statistical aspects of the degradation of LDD nMOSFETs.
Microelectron. Reliab., 2002


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