Dwayne Burek

According to our database, Dwayne Burek authored at least 6 papers between 1992 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

OCI: Open Compression Interface.

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

An Integrated Memory Self Test and EDA Solution.

R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald

Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

2002

Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.

Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

IP and Automation to Support IEEE P1500.

Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1994

ScanBist: A Multifrequency Scan-Based BIST Method.

Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan

IEEE Des. Test Comput., 1994

1992

ScanBIST: A Multi-frequency Scan-based BIST Method.

Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992