Duyeon Won
Orcid: 0009-0004-0738-4702Timeline
2025
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Bibliography
2025
IEEE Trans. Very Large Scale Integr. Syst., February, 2025
PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2025