Durga Misra

According to our database1, Durga Misra authored at least 14 papers between 2001 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2023
Enabling Normally-off In-Situ Computing with a Magneto-Electric FET-based SRAM Design.
CoRR, 2023

2022
FlexiDRAM: A Flexible in-DRAM Framework to Enable Parallel General-Purpose Computation.
Proceedings of the ISLPED '22: ACM/IEEE International Symposium on Low Power Electronics and Design, Boston, MA, USA, August 1, 2022

ReD-LUT: Reconfigurable In-DRAM LUTs Enabling Massive Parallel Computation.
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

Toward a Behavioral-Level End-to-End Framework for Silicon Photonics Accelerators.
Proceedings of the 13th IEEE International Green and Sustainable Computing Conference, 2022

2018
Wide Bandgap Materials for Semiconductor Devices.
Microelectron. Reliab., 2018

Ambient temperature and layout impact on self-heating characterization in FinFET devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017
MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus.
NeuroImage, 2017

2015
Reliability of HfAlOx in multi layered gate stack.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2013
Voltage and current stress induced variations in TiN/HfSi<sub>x</sub>O<sub>y</sub>/TiN MIM capacitors.
Microelectron. Reliab., 2013

2009
Temperature dependent time-to-breakdown (T<sub>BD</sub>) of TiN/HfO<sub>2</sub> n-channel MOS devices in inversion.
Microelectron. Reliab., 2009

2007
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks.
Microelectron. Reliab., 2007

2004
Screening of Hot Electron Effect During Plasma Processing.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2002
A Synthesizable VHDL Model of the Exact Solution for Three-dimensional Hyperbolic Positioning System.
VLSI Design, 2002

2001
Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions.
Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001


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