Duhyun Jeon
Orcid: 0000-0003-1305-3462
According to our database1,
Duhyun Jeon
authored at least 4 papers
between 2015 and 2023.
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Bibliography
2023
A 325F<sup>2</sup> Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio.
IEEE J. Solid State Circuits, 2023
2022
Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
2020
A Physical Unclonable Function With Bit Error Rate × 10<sup>-8</sup> Based on Contact Formation Probability Without Error Correction Code.
IEEE J. Solid State Circuits, 2020
2015
Towards Zero Bit-Error-Rate Physical Unclonable Function: Mismatch-Based vs. Physical-Based Approaches in Standard CMOS Technology.
Proceedings of the 2015 Euromicro Conference on Digital System Design, 2015