Du-Ming Tsai
Orcid: 0000-0001-8783-7994
According to our database1,
Du-Ming Tsai
authored at least 74 papers
between 1992 and 2024.
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Bibliography
2024
IEEE Trans Autom. Sci. Eng., July, 2024
2022
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2022
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes.
IEEE Trans Autom. Sci. Eng., 2022
2021
IEEE Trans. Instrum. Meas., 2021
Adv. Eng. Informatics, 2021
2020
IEEE Trans. Instrum. Meas., 2020
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2020
2019
Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification.
Proceedings of the 14th International Joint Conference on Computer Vision, 2019
2017
Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique.
IEEE Trans. Instrum. Meas., 2017
Comput. Electron. Agric., 2017
2015
Signal Image Video Process., 2015
Defect detection in multi-crystal solar cells using clustering with uniformity measures.
Adv. Eng. Informatics, 2015
Proceedings of the 14th IAPR International Conference on Machine Vision Applications, 2015
Proceedings of the Intelligent Robots and Computer Vision XXXII: Algorithms and Techniques, 2015
2014
J. Real Time Image Process., 2014
2013
IEEE Trans. Ind. Informatics, 2013
Ind. Robot, 2013
Proceedings of the 13. IAPR International Conference on Machine Vision Applications, 2013
2012
IEEE Trans. Ind. Informatics, 2012
Pattern Recognit., 2012
ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds.
Proceedings of the GRAPP & IVAPP 2012: Proceedings of the International Conference on Computer Graphics Theory and Applications and International Conference on Information Visualization Theory and Applications, 2012
2011
IEEE Trans. Ind. Informatics, 2011
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection.
IEEE Trans. Ind. Informatics, 2011
Pattern Recognit., 2011
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis.
Mach. Vis. Appl., 2011
2010
Pattern Recognit. Lett., 2010
Defect detection of uneven brightness in low-contrast images using basis image representation.
Pattern Recognit., 2010
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images.
Pattern Recognit., 2010
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion.
Image Vis. Comput., 2010
A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences.
EURASIP J. Adv. Signal Process., 2010
A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection.
Proceedings of the Symposia and Workshops on Ubiquitous, 2010
Proceedings of the 20th International Conference on Pattern Recognition, 2010
Proceedings of the International Conference on Image Processing, 2010
2009
IEEE Trans. Image Process., 2009
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations.
Mach. Vis. Appl., 2009
2008
Defect detection in periodically patterned surfaces using independent component analysis.
Pattern Recognit., 2008
Independent component analysis-based defect detection in patterned liquid crystal display surfaces.
Image Vis. Comput., 2008
Image Vis. Comput., 2008
2007
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction.
Mach. Vis. Appl., 2007
2006
Pattern Recognit. Lett., 2006
An independent component analysis-based filter design for defect detection in low-contrast surface images.
Pattern Recognit., 2006
Independent component analysis based filter design for defect detection in low-contrast textured images.
Proceedings of the 18th International Conference on Pattern Recognition (ICPR 2006), 2006
Proceedings of the 18th International Conference on Pattern Recognition (ICPR 2006), 2006
2005
Pattern Recognit. Lett., 2005
Pattern Recognit. Lett., 2005
Image Vis. Comput., 2005
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures.
Image Vis. Comput., 2005
2003
Pattern Recognit. Lett., 2003
Pattern Recognit. Lett., 2003
Mach. Vis. Appl., 2003
Automatic band selection for wavelet reconstruction in the application of defect detection.
Image Vis. Comput., 2003
2002
Pattern Recognit. Lett., 2002
Pattern Recognit., 2002
2001
Image Vis. Comput., 2001
1999
Pattern Recognit. Lett., 1999
Pattern Recognit. Lett., 1999
1998
1997
Image Vis. Comput., 1997
1996
Pattern Recognit. Lett., 1996
1995
Pattern Recognit. Lett., 1995
J. Intell. Robotic Syst., 1995
1994
Pattern Recognit., 1994
1992
Pattern Recognit. Lett., 1992