Dragoljub Gagi Drmanac

According to our database, Dragoljub Gagi Drmanac authored at least 12 papers between 2008 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

Innovative practices session 5C: Machine learning and data analysis in test.

Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2011

Understanding customer returns from a test perspective.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Forward prediction based on wafer sort data - A case study.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 2011 IEEE International Test Conference, 2011

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.

Dragoljub Gagi Drmanac, Michael Laisne

Proceedings of the 2011 IEEE International Test Conference, 2011

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.

Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Mining AC delay measurements for understanding speed-limiting paths.

Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja

Proceedings of the 2011 IEEE International Test Conference, 2010

A non-parametric approach to behavioral device modeling.

Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Online selection of effective functional test programs based on novelty detection.

Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch.

Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir

Proceedings of the 47th Design Automation Conference, 2010

2009

Minimizing outlier delay test cost in the presence of systematic variability.

Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2009 IEEE International Test Conference, 2009

Predicting variability in nanoscale lithography processes.

Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang

Proceedings of the 46th Design Automation Conference, 2009

2008

A Study of Outlier Analysis Techniques for Delay Testing.

Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang

Proceedings of the 2008 IEEE International Test Conference, 2008