Doyoung Jang
Orcid: 0000-0002-5629-8294
According to our database1,
Doyoung Jang
authored at least 19 papers
between 2013 and 2025.
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Bibliography
2025
Real-Time Duct Prediction and Propagation Analysis Using Genetic Algorithm-Based RFC and Parabolic Equation Method.
IEEE Access, 2025
2024
Kriging Interpolation for Constructing Database of the Atmospheric Refractivity in Korea.
Remote. Sens., July, 2024
Prediction of Atmospheric Duct Conditions from a Clutter Power Spectrum Using Deep Learning.
Remote. Sens., February, 2024
Design of a Dual-Band Shared-Aperture Array Antenna Composed of Array Elements With High Electromagnetic Transparency.
IEEE Access, 2024
Design of a Shared-Aperture Dual-Loop Antenna Using a Mutual Complementary Shape to Improve an Electromagnetic Transparent Characteristics Between S/X-Band Elements.
IEEE Access, 2024
2021
IEEE Access, 2021
2020
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020
2018
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2017
Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017
Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2016
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016
Proceedings of the The 15th International Conference on Interaction Design and Children, 2016
2015
Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.
Microprocess. Microsystems, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015
2014
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014
2013
STI and eSiGe source/drain epitaxy induced stress modeling in 28 nm technology with replacement gate (RMG) process.
Proceedings of the European Solid-State Device Research Conference, 2013