Douglas Racz

According to our database1, Douglas Racz authored at least 3 papers between 1998 and 2000.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2000
Comprehensive defect analysis and testability of current-mode logic circuits.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

Comparing defect coverage for current-mode logic and CMOS VLSI cells.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

1998
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998


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