Douglas Brisbin

According to our database, Douglas Brisbin authored at least 3 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2005

Impact of NBTI and HCI on PMOSFET threshold voltage drift.

Prasad Chaparala, Douglas Brisbin

Microelectron. Reliab., 2005

Optimizing the hot carrier reliability of N-LDMOS transistor arrays.

Douglas Brisbin, Andy Strachan, Prasad Chaparala

Microelectron. Reliab., 2005

2002

Influence of test techniques on soft breakdown detection in ultra-thin oxides.

Douglas Brisbin, Prasad Chaparala

Microelectron. Reliab., 2002