Douglas A. Buchanan

According to our database, Douglas A. Buchanan authored at least 12 papers between 1995 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Effect of Middle Membrane Dimensions on Dynamic Control Range in Dual Membrane Capacitive Micromachined Ultrasonic Transducers.

Bruce Ye, Haleh Nazemi, Pavithra Munirathinam, Douglas A. Buchanan, Arezoo Emadi

IEEE Access, 2024

2021

Design, Development, and Characterization of a Low Frequency CMUT-Based Anemometer.

Mayank B. Thacker, Arezoo Emadi, Douglas A. Buchanan

IEEE Access, 2021

2020

Design and Characterization of low frequency Capacitive Micromachined Ultrasonic Transducer (CMUT).

Mayank B. Thacker, Douglas A. Buchanan

Proceedings of the 2020 IEEE International Conference on Systems, Man, and Cybernetics, 2020

2019

A dual gate MOS-based olfactory system functionalized using conducting polymers.

V. Dubey, Michael S. Freund, Douglas A. Buchanan

Proceedings of the 2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019, 2019

2016

Integrated 0.35 pm CMOS capacitance sensor with atto-farad sensitivity for single cell analysis.

Kaveh Mohammad, Douglas A. Buchanan, Douglas J. Thomson

Proceedings of the IEEE Biomedical Circuits and Systems Conference, 2016

2014

Low frequency ultrasound NDT of power cable insulation.

Gabriel Thomas, Arezoo Emadi, Jose Juan Mijares Chan, Douglas A. Buchanan

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2014

2012

Phase transition in sputtered HfO2 thin films: A qualitative raman study.

Gustavo S. Belo, Fabio Nakagomi, Auxence Minko, Sebastião William da Silva, Paulo César de Morais, Douglas A. Buchanan

Proceedings of the 25th IEEE Canadian Conference on Electrical and Computer Engineering, 2012

1999

Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides.

Shih-Hsien Lo, Douglas A. Buchanan, Yuan Taur

IBM J. Res. Dev., 1999

Scaling the gate dielectric: Materials, integration, and reliability.

Douglas A. Buchanan

IBM J. Res. Dev., 1999

Preface.

Douglas A. Buchanan

IBM J. Res. Dev., 1999

1997

CMOS scaling into the nanometer regime.

Yuan Taur, Douglas A. Buchanan, Wei Chen, David J. Frank, Khalid E. Ismail, Shih-Hsien Lo, George A. Sai-Halasz, Raman G. Viswanathan, Hsing-Jen C. Wann, Shalom J. Wind, Hon-Sum Philip Wong

Proc. IEEE, 1997

1995

CMOS scaling into the 21st century: 0.1 µm and beyond.

Yuan Taur, Yuh-Jier Mii, David J. Frank, H.-S. Philip Wong, Douglas A. Buchanan, Shalom J. Wind, Stephen A. Rishton, Watson A. Sai-Halasz, Edward J. Nowak

IBM J. Res. Dev., 1995