Dongqing Hu
Orcid: 0000-0002-2793-3594
According to our database1,
Dongqing Hu
authored at least 12 papers
between 2018 and 2023.
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Bibliography
2023
Automated Region Learning Via Cell-Level Labels to Modify Cell Detection Process For Histopathological Images.
Proceedings of the 20th IEEE International Symposium on Biomedical Imaging, 2023
Optimized Design of Trench Termination for High-Voltage β-Ga2O3 Trench MOS Barrier Schottky Diode with Anode Electrode Extension.
Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering, 2023
Improvement of reverse recovery characteristics through integration of MOS-barrier Schottky diode in SiC superjunction structure.
Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering, 2023
2022
Invariant Content Synergistic Learning for Domain Generalization of Medical Image Segmentation.
CoRR, 2022
Simulation study of 1200V SiC-based trench-gate MOSFET with vertical field plate protection.
Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering, 2022
Design and simulation study of multi-trench termination for 1200V SiC devices with charge coupled drift region.
Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering, 2022
A 4H-SiC Trench MOSFET with the vertical field plate coupled floating island and two epi-layers.
Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering, 2022
2021
Investigation of Anti-SEB Capability of 160 V Power MOSFET Device with Multiple Buffer Layer.
Proceedings of the EITCE 2021: 5th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, October 22, 2021
Proceedings of the EITCE 2021: 5th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, October 22, 2021
Proceedings of the IEEE International Conference on Bioinformatics and Biomedicine, 2021
2020
Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts.
Proceedings of the EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020, 2020
2018
Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes.
Microelectron. Reliab., 2018