We stand with Ukraine

We stand with Ukraine

Dongil Kim

Orcid: 0000-0001-7425-7579

According to our database¹, Dongil Kim authored at least 31 papers between 2004 and 2024.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

Legend:

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In proceedings

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PhD thesis

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Links

On csauthors.net:

Bibliography

2024

Attention-based sequential recommendation system using multimodal data.

[BibT_eX]

[DOI]

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CoRR, 2024

NFCL: Simply interpretable neural networks for a short-term multivariate forecasting.

[BibT_eX]

[DOI]

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CoRR, 2024

2023

Neural additive time-series models: Explainable deep learning for multivariate time-series prediction.

[BibT_eX]

[DOI]

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Expert Syst. Appl., October, 2023

Deep learning-based cutting force prediction for machining process using monitoring data.

[BibT_eX]

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Pattern Anal. Appl., August, 2023

2022

Depressed Mood Prediction of Elderly People with a Wearable Band.

[BibT_eX]

[DOI]

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Sensors, 2022

OBGAN: Minority oversampling near borderline with generative adversarial networks.

[BibT_eX]

[DOI]

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Expert Syst. Appl., 2022

Neural Additive Models for Nowcasting.

[BibT_eX]

[DOI]

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CoRR, 2022

A Study on the Cultivation Plan Service at the Preliminary production phase based on bigdata analysis.

[BibT_eX]

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Proceedings of the 24th International Conference on Advanced Communication Technology, 2022

A Study on the Service model of risk mitigation on livestock pandemic based on Networks.

[BibT_eX]

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Proceedings of the 24th International Conference on Advanced Communication Technology, 2022

2020

Expected margin-based pattern selection for support vector machines.

[BibT_eX]

[DOI]

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Expert Syst. Appl., 2020

Study on Service model of the Agriculture Information based Convergence Service.

[BibT_eX]

[DOI]

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Kyoung-Sook Jung

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Byeong-Beom Kang

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Proceedings of the 22nd International Conference on Advanced Communication Technology, 2020

2019

Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis.

[BibT_eX]

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Int. J. Distributed Sens. Networks, 2019

Demand Forecasting from Spatiotemporal Data with Graph Networks and Temporal-Guided Embedding.

[BibT_eX]

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CoRR, 2019

Approximate training of one-class support vector machines using expected margin.

[BibT_eX]

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Comput. Ind. Eng., 2019

Pilot Testing of an ICT-Based Care Management Support System to Deliver Integrated Community Care.

[BibT_eX]

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Proceedings of the MEDINFO 2019: Health and Wellbeing e-Networks for All, 2019

Development of ICT-Based Comprehensive Health and Social-Needs Assessment System to Enhance Person-Centered Community Care.

[BibT_eX]

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Proceedings of the MEDINFO 2019: Health and Wellbeing e-Networks for All, 2019

Smart Farming Education Service based on u-learning environment.

[BibT_eX]

[DOI]

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Proceedings of the 21st International Conference on Advanced Communication Technology, 2019

2016

Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing.

[BibT_eX]

[DOI]

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Expert Syst. Appl., 2016

A latent profile analysis of the interplay between PC and smartphone in problematic internet use.

[BibT_eX]

[DOI]

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JeeEun Karin Nam

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Comput. Hum. Behav., 2016

2015

Improvement of virtual metrology performance by removing metrology noises in a training dataset.

[BibT_eX]

[DOI]

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Seung-kyung Lee

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Pattern Anal. Appl., 2015

2014

Evaluating the reliability level of virtual metrology results for flexible process control: a novelty detection-based approach.

[BibT_eX]

[DOI]

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Pattern Anal. Appl., 2014

2012

Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing.

[BibT_eX]

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Expert Syst. Appl., 2012

Pattern selection for support vector regression based response modeling.

[BibT_eX]

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Expert Syst. Appl., 2012

2011

Virtual metrology for run-to-run control in semiconductor manufacturing.

[BibT_eX]

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Expert Syst. Appl., 2011

2010

Efficient peer-to-peer overlay networks for mobile IPTV services.

[BibT_eX]

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IEEE Trans. Consumer Electron., 2010

2009

A virtual metrology system for semiconductor manufacturing.

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Expert Syst. Appl., 2009

2008

Response modeling with support vector regression.

[BibT_eX]

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Expert Syst. Appl., 2008

Bootstrap Based Pattern Selection for Support Vector Regression.

[BibT_eX]

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Proceedings of the Advances in Knowledge Discovery and Data Mining, 2008

2007

Performance comparison of classifiers for differentiation among obstructive lung diseases based on features of texture analysis at HRCT.

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Proceedings of the Medical Imaging 2007: Image Processing, 2007

2006

epsilon-Tube Based Pattern Selection for Support Vector Machines.

[BibT_eX]

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Proceedings of the Advances in Knowledge Discovery and Data Mining, 2006

2004

Segmentation of Chinese Long Sentences Using Commas.

[BibT_eX]

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Proceedings of the Third Workshop on Chinese Language Processing, 2004

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