Donghoon Han

Nojun Kwak

Proceedings of the 11th International Conference on Pattern Recognition Applications and Methods, 2022

Few-Shot Image Generation with Mixup-Based Distance Learning.

[BibT_eX]

[DOI]

Proceedings of the Computer Vision - ECCV 2022, 2022

2021

Smoothing the Generative Latent Space with Mixup-based Distance Learning.

[BibT_eX]

[DOI]

CoRR, 2021

2019

automaTA: Human-Machine Interaction for Answering Context-Specific Questions.

[BibT_eX]

[DOI]

Proceedings of the Sixth ACM Conference on Learning @ Scale, 2019

Crowdsourcing Perspectives on Public Policy from Stakeholders.

[BibT_eX]

[DOI]

Proceedings of the Extended Abstracts of the 2019 CHI Conference on Human Factors in Computing Systems, 2019

2010

DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability.

[BibT_eX]

[DOI]

Byung-Sung Kim

IEEE Trans. Very Large Scale Integr. Syst., 2010

Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint.

[BibT_eX]

[DOI]

N. Balakrishnan

Comput. Stat. Data Anal., 2010

2009

Iterative built-in testing and tuning of mixed-signal/RF systems.

[BibT_eX]

[DOI]

Vishwanath Natarajan

Shyam Kumar Devarakond

Shreyas Sen

Hyun Woo Choi

Rajarajan Senguttuvan

Abhilash Goyal

Deuk Lee

Madhavan Swaminathan

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters.

[BibT_eX]

[DOI]

Rajarajan Senguttuvan

Hyun Woo Choi

Proceedings of the 13th European Test Symposium, 2008

2007

Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection.

[BibT_eX]

[DOI]

IET Comput. Digit. Tech., 2007

Optimal Progressive Type-II Censoring Schemes for Nonparametric Confidence Intervals of Quantiles.

[BibT_eX]

[DOI]

N. Balakrishnan

Commun. Stat. Simul. Comput., 2007

Enhanced Resolution Jitter Testing Using Jitter Expansion.

[BibT_eX]

[DOI]

Hyun Woo Choi

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring".

[BibT_eX]

[DOI]

IEEE Trans. Reliab., 2006

Low Cost Parametric Failure Diagnosis of RF Transceivers.

[BibT_eX]

[DOI]

Shalabh Goyal

Proceedings of the 11th European Test Symposium, 2006

Evaluation of adaptive cruise control algorithms on a virtual test track.

[BibT_eX]

[DOI]

Kyongsu Yi

Proceedings of the American Control Conference, 2006

2005

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).

[BibT_eX]

[DOI]

Selim Sermet Akbay

William R. Eisenstadt

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

Robust Built-In Test of RF ICs Using Envelope Detectors.

[BibT_eX]

[DOI]

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Adaptive response surface modeling-based method for analog circuit sizing.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004

Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing.

[BibT_eX]

[DOI]

Proceedings of the 4th IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC'04), 2004

Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study.

[BibT_eX]

[DOI]