Donggun Park

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Known people with the same name:

Bibliography

2025
Comparing typing methods for uppercase input in virtual reality: Modifier Key vs. alternative approaches.
Int. J. Hum. Comput. Stud., 2025

2010
A 31 ns Random Cycle VCAT-Based 4F <sup>2</sup> DRAM With Manufacturability and Enhanced Cell Efficiency.
IEEE J. Solid State Circuits, 2010

2007
The future outlook of memory devices.
Proceedings of the 33rd European Solid-State Circuits Conference, 2007

2003
Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide.
Microelectron. Reliab., 2003


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