Dong Ni
Orcid: 0000-0002-2227-2555Affiliations:
- Zhejiang University, College of Control Science and Engineering, Hangzhou, China
According to our database1,
Dong Ni
authored at least 17 papers
between 2017 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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on publons.com
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on orcid.org
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Bibliography
2024
A method for real-time optimal heliostat aiming strategy generation via deep learning.
Eng. Appl. Artif. Intell., January, 2024
A self-supervised learning framework based on masked autoencoder for complex wafer bin map classification.
Expert Syst. Appl., 2024
Correlation analysis of sampled wafer profile maps based on a deep reconstruction model.
Appl. Soft Comput., 2024
Optimizing Plasma Etching: Integrating Precise Three-Dimensional Etching Simulation and Machine Learning for Multi-Objective Optimization.
IEEE Access, 2024
From Denoising Training to Test-Time Adaptation: Enhancing Domain Generalization for Medical Image Segmentation.
Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2024
Proceedings of the Forty-first International Conference on Machine Learning, 2024
LUM-ViT: Learnable Under-sampling Mask Vision Transformer for Bandwidth Limited Optical Signal Acquisition.
Proceedings of the Twelfth International Conference on Learning Representations, 2024
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024
2023
Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023
2022
Proceedings of the Advances in Neural Information Processing Systems 35: Annual Conference on Neural Information Processing Systems 2022, 2022
Detecting Human-Object Interactions with Object-Guided Cross-Modal Calibrated Semantics.
Proceedings of the Thirty-Sixth AAAI Conference on Artificial Intelligence, 2022
2021
Proceedings of the 2021 IEEE/CVF International Conference on Computer Vision, 2021
Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021
2019
Eur. J. Control, 2019
2018
Proceedings of the 2018 International Conference on IC Design & Technology, 2018
2017
A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits.
Proceedings of the 13th IEEE Conference on Automation Science and Engineering, 2017