Donato O. Forlenza

According to our database, Donato O. Forlenza authored at least 7 papers between 1985 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Testing the IBM Power 7™ 4 GHz eight core microprocessor.

James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Structural and functional test of IBM System z10 chips.

Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur

IBM J. Res. Dev., 2009

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).

Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza

Proceedings of the 2009 IEEE International Test Conference, 2009

1999

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1997

Application and Analysis of IDDQ Diagnostic Software.

Phil Nigh, Donato O. Forlenza, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1990

Weighted random test program generation for a per-pin tester.

Jeff Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1985

A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.

John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy

Proceedings of the Proceedings International Test Conference 1985, 1985