Donald L. Wheater

According to our database, Donald L. Wheater authored at least 12 papers between 1981 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2003

An On-Chip Self-Repair Calculation and Fusing Methodology.

Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater

IEEE Des. Test Comput., 2003

ATE-Customer Perspectives & Requirements Panel.

Donald L. Wheater

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Guest Editors' Introduction: Stressing the Fundamentals.

Robert C. Aitken, Donald L. Wheater

IEEE Des. Test Comput., 2002

A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required?

Lee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

On-Chip Repair and an ATE Independent Fusing Methodology.

Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Test Trade-Offs Take Center Stage at ITC.

Tony Ambler, Donald L. Wheater

IEEE Des. Test Comput., 2001

A SmartBIST Variant with Guaranteed Encoding.

Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1997

Will 0.1um Digital Circuits Require Mixed-Signal Testing.

Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1994

ASIC Test Cost/Strategy Trade-offs.

Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1990

Low-Cost Testing of High-Density Logic Components.

Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater

IEEE Des. Test Comput., 1990

1984

IBM's Cost Performance Array Tester Architecture for the 80's.

Donald L. Wheater

Proceedings of the Proceedings International Test Conference 1984, 1984

1981

The Series/1 as a Test System Controller for System Verification and Calibration.

Donald L. Wheater, Richard Soderman

Proceedings of the Proceedings International Test Conference 1981, 1981