Dominique Laffitte

According to our database, Dominique Laffitte authored at least 8 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.

S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto

Microelectron. Reliab., 2005

2004

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.

Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé

Microelectron. Reliab., 2004

2003

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.

Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Reliability of optoelectronics components: towards new qualification practices.

Jean-Luc Goudard, X. Boddaert, J. Périnet, Dominique Laffitte

Microelectron. Reliab., 2003

New method of qualification applied to optical amplifier with electronics.

C. Gautier, J. Périnet, E. Nissou, Dominique Laffitte

Microelectron. Reliab., 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.

Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

High reliability level demonstrated on 980nm laser diode.

J. Van de Casteele, Dominique Laffitte, G. Gelly, C. Starck, M. Bettiati

Microelectron. Reliab., 2003

2002

New qualification approach for optoelectronic components.

Jean-Luc Goudard, P. Berthier, X. Boddaert, Dominique Laffitte, J. Périnet

Microelectron. Reliab., 2002