Dominik Erb

According to our database, Dominik Erb authored at least 20 papers between 2013 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2018

On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.

Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Characterization of possibly detected faults by accurately computing their detection probability.

Jan Burchard, Dominik Erb, Bernd Becker

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.

Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker

J. Electron. Test., 2017

Efficient SAT-based generation of hazard-activated TSOF tests.

Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.

Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

Evaluating the effectiveness of D-chains in SAT-based ATPG.

Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG.

Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

On the handling of uncertainty in test pattern generation.

Dominik Erb

PhD thesis, 2016

Applying Tailored Formal Methods to X-ATPG.

Karsten Scheibler, Dominik Erb, Bernd Becker

Proceedings of the 19th GI/ITG/GMM Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 2016

Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs.

Karsten Scheibler, Dominik Erb, Bernd Becker

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns.

Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015

Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values.

Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects.

Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Improving test pattern generation in presence of unknown values beyond restricted symbolic logic.

Karsten Scheibler, Dominik Erb, Bernd Becker

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Exact Logic and Fault Simulation in Presence of Unknowns.

Dominik Erb, Michael A. Kochte, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker

ACM Trans. Design Autom. Electr. Syst., 2014

Test pattern generation in presence of unknown values based on restricted symbolic logic.

Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker

Proceedings of the 2014 International Test Conference, 2014

Efficient SMT-based ATPG for interconnect open defects.

Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.

Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Accurate QBF-based test pattern generation in presence of unknown values.

Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker

Proceedings of the Design, Automation and Test in Europe, 2013

Accurate Multi-cycle ATPG in Presence of X-Values.

Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker

Proceedings of the 22nd Asian Test Symposium, 2013