Dominic Waldhör

According to our database, Dominic Waldhör authored at least 7 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs.

Tibor Grasser, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Dominic Waldhör, A. Vasilev, Michael Waltl, Thomas Aichinger, M. Bockstedte, Wolfgang Gustin, Gregor Pobegen

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Exploring the Global Solution Space of a Simple Schrödinger-Poisson Problem.

Robert Kosik, Johann Cervenka, Dominic Waldhör, Felipe Ribeiro, Hans Kosina

Proceedings of the Large-Scale Scientific Computations - 14th International Conference, 2023

2022

Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities.

Christoph Wilhelmer, Dominic Waldhoer, Markus Jech, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Michael Waltl, Tibor Grasser

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

Silicon-Impurity Defects in Calcium Fluoride: A First Principles Study.

Dominic Waldhoer, Bibhas Manna, Al-Moatasem Bellah El-Sayed, Theresia Knobloch, Yury Illarionov, Tibor Grasser

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.

Christoph Wilhelmer, Markus Jech, Dominic Waldhoer, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Tibor Grasser

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide.

Diego Milardovich, Markus Jech, Dominic Waldhoer, Al-Moatasem Bellah El-Sayed, Tibor Grasser

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface.

Lukas Cvitkovich, Markus Jech, Dominic Waldhör, Al-Moatasem El-Sayed, Christoph Wilhelmer, Tibor Grasser

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021