Doh-Soon Kwak
According to our database1,
Doh-Soon Kwak
authored at least 3 papers
between 2010 and 2023.
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Bibliography
2023
Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2012
A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes.
Expert Syst. Appl., 2012
2010
A case study on modeling and optimizing photolithography stage of semiconductor fabrication process.
Qual. Reliab. Eng. Int., 2010