Dishant Sangani

According to our database, Dishant Sangani authored at least 5 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays.

Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers.

Dishant Sangani, Ben Kaczer, Pieter Weckx, Philippe J. Roussel, Subrat Mishra, Erik Jan Marinissen, Georges G. E. Gielen

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Silent Data Corruption: Test or Reliability Problem?

Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2024

2023

The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper).

Dishant Sangani, Javier Diaz-Fortuny, Erik Bury, Ben Kaczer, Georges G. E. Gielen

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation.

Javier Diaz-Fortuny, Dishant Sangani, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, Ben Kaczer

Proceedings of the IEEE International Reliability Physics Symposium, 2023