Ding-Jhang Lin

According to our database, Ding-Jhang Lin authored at least 3 papers between 2018 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories.

Nian-Jia Wang, Kuan-Yi Lee, Hsin-Yi Lin, Wei-Hao Hsiao, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Modeling of Apparent Activation Energy and Lifetime Estimation for Retention of 3D SGVC Memory.

Wei-Hao Hsiao, Nian-Jia Wang, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Electrical method to localize the high-resistance of nanoscale CoSi2 word-line for OTP memories.

Ming-Yi Lee, T.-Y. Chang, W.-F. Hsueh, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, U. J. Tzeng, Chih-Yuan Lu

Proceedings of the IEEE International Reliability Physics Symposium, 2018