Dimitrios H. Tassis

According to our database, Dimitrios H. Tassis authored at least 7 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2023

A CMOS Threshold Voltage Monitoring Sensor.

Konstantinos Moustakas, Vasiliki Gogolou, Thomas Noulis, Dimitrios H. Tassis, Stylianos Siskos

Proceedings of the 12th International Conference on Modern Circuits and Systems Technologies, 2023

2014

Variability of nanoscale triple gate FinFETs: Prediction and analysis method.

Dimitrios H. Tassis, Ioannis Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis

Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

2012

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs.

Nikolaos Fasarakis, Andreas Tsormpatzoglou, Dimitrios H. Tassis, Konstantinos Papathanasiou, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

2010

Characteristics of double-gate polycrystalline silicon thin-film transistors for AMOLED pixel design.

Ilias Pappas, Dimitrios H. Tassis, Stilianos Siskos, Charalambos A. Dimitriadis

Proceedings of the 17th IEEE International Conference on Electronics, 2010

2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.

N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos

Microelectron. Reliab., 2008

2006

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Effects of hot carriers in offset gated polysilicon thin-film transistors.

Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006