Dilip K. Bhavsar

According to our database, Dilip K. Bhavsar authored at least 23 papers between 1981 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2011

Harmony Widget for X-free scan testing.

Dilip K. Bhavsar

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Test access and the testability features of the Poulson multi-core Intel Itanium® processor.

Dilip K. Bhavsar, Steve Poehlman

Proceedings of the 2011 IEEE International Test Conference, 2011

2005

A Built-in Self-Test Method for Write-only Content Addressable Memories.

Dilip K. Bhavsar

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2003

Testability Features of the Alpha 21364 Microprocessor.

Scott Erlanger, Dilip K. Bhavsar, Richard A. Davies

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.

Joel Grodstein, Dilip K. Bhavsar, Vijay Bettada, Richard A. Davies

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

2002

Scan Islands - A Scan Partitioning Architecture and its Implementation on the Alpha 21364 Processor.

Dilip K. Bhavsar, Richard A. Davies

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

Scan Wheel - A Technique for Interfacing a High Speed Scan-Path with a Slow Speed Tester.

Dilip K. Bhavsar

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Observability Register Architecture For Efficient Production Test And Debug Of Vlsi Circuits.

Dilip K. Bhavsar, Rishan Tan

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

2000

Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability.

Dilip K. Bhavsar

IEEE Des. Test Comput., 2000

1999

ITC 99 Panels.

Dilip K. Bhavsar

IEEE Des. Test Comput., 1999

An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264.

Dilip K. Bhavsar

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

ITC 97 Panel Sessions.

Dilip K. Bhavsar, Yervant Zorian

IEEE Des. Test Comput., 1998

A highly testable and diagnosable fabrication process test chip.

Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Testability access of the high speed test features in the Alpha 21264 microprocessor.

Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Alpha 21164 Testability Strategy.

Dilip K. Bhavsar, John H. Edmondson

IEEE Des. Test Comput., 1997

1994

Testability Strategy of the ALPHA AXP 21164 Microprocessor.

Dilip K. Bhavsar, John H. Edmondson

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1991

Testing Interconnections to Static RAMs.

Dilip K. Bhavsar

IEEE Des. Test Comput., 1991

An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes.

Dilip K. Bhavsar

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1986

A New Economical Implementation for Scannable Flip-Flops in MOS.

Dilip K. Bhavsar

IEEE Des. Test, 1986

1985

"Concatenable Polydividers": Bit-Sliced LFSR Chips for Board Self-Test.

Dilip K. Bhavsar

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Can We Eliminate Fault Escape in Self-Testing by Polynomial Division (Signature Analysis) ?

Dilip K. Bhavsar, Balakrishnan Krishnamurthy

Proceedings of the Proceedings International Test Conference 1984, 1984

1983

Design For Test Calculus: An algorithm for DFT rules checking.

Dilip K. Bhavsar

Proceedings of the 20th Design Automation Conference, 1983

1981

Self-Testing by Polynomial Division.

Dilip K. Bhavsar, Richard W. Heckelman

Proceedings of the Proceedings International Test Conference 1981, 1981