Diego Vázquez

Juan Carlos Merlano Duncan

Robson Luiz Moreno

Ole K. Jensen

Symeon Chatzinotas

Björn E. Ottersten

Proceedings of the 14th IEEE Latin America Symposium on Circuits and System, 2023

2013

Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA.

[BibT_eX]

[DOI]

Jorge Luis González Rios

Juan Carlos Cruz

Proceedings of the 4th IEEE Latin American Symposium on Circuits and Systems, 2013

Sinusoidal signal generation for mixed-signal BIST using a harmonic-cancellation technique.

[BibT_eX]

[DOI]

Proceedings of the 4th IEEE Latin American Symposium on Circuits and Systems, 2013

2011

Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications.

[BibT_eX]

[DOI]

J. Electron. Test., 2011

A 3.6mW @ 1.2V high linear 8<sup>th</sup>-order CMOS complex filter for IEEE 802.15.4 standard.

[BibT_eX]

[DOI]

Proceedings of the 37th European Solid-State Circuits Conference, 2011

2.4-GHz single-ended input low-power low-voltage active front-end for ZigBee applications in 90 nm CMOS.

[BibT_eX]

[DOI]

Proceedings of the 20th European Conference on Circuit Theory and Design, 2011

2010

A BIST Solution for Frequency Domain Characterization of Analog Circuits.

[BibT_eX]

[DOI]

J. Electron. Test., 2010

Low-cost signature test of RF blocks based on envelope response analysis.

[BibT_eX]

[DOI]

Proceedings of the 15th European Test Symposium, 2010

A low power low voltage mixer for 2.4GHz applications in CMOS-90nm technology.

[BibT_eX]

[DOI]

Alberto Villegas

Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010

2009

A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis.

[BibT_eX]

[DOI]

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

A 2.4GHz LNA in a 90-nm CMOS technology designed with ACM model.

[BibT_eX]

[DOI]

Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, 2008

Practical Implementation of a Network Analyzer for Analog BIST Applications.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2008

A 1.2V 5.14mW quadrature frequency synthesizer in 90nm CMOS technology for 2.4GHz ZigBee applications.

[BibT_eX]

[DOI]

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

2006

A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology.

[BibT_eX]

[DOI]

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Test of switched-capacitor ladder filters using OBT.

[BibT_eX]

[DOI]

Microelectron. J., 2005

A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation.

[BibT_eX]

[DOI]

Microelectron. J., 2005

Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST.

[BibT_eX]

[DOI]

Gloria Huertas

África Luque

Gildas Léger

J. Electron. Test., 2005

2004

A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications.

[BibT_eX]

[DOI]

Proceedings of the 2004 Design, 2004

2003

Oscillation-based test in bandpass oversampled A/D converters.

[BibT_eX]

[DOI]

Microelectron. J., 2003

2002

Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2002

Practical Oscillation-Based Test of Integrated Filters.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2002

Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Low-cost on-chip measurements for Oscillation-Based-Test in Analog Integrated Circuits.

[BibT_eX]

Proceedings of the 3rd Latin American Test Workshop, 2002

Practical solutions for the application of the oscillation-based-test in analog integrated circuits.

[BibT_eX]

[DOI]

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

Design of a switched opamp-based bandpass filter in a 0.35 μm CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results.

[BibT_eX]

[DOI]

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

Design of a CMOS fully differential switched-opamp for SC circuits at very low power supply voltages.

[BibT_eX]

[DOI]

Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

2000

Built-In Self-Test in Mixed-Signal ICs: A DTMF Macrocell.

[BibT_eX]

[DOI]

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

1999

Effective oscillation-based test for application to a DTMF filter bank.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

A high-Q bandpass fully differential SC filter with enhanced testability.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, 1998

Switch-Level Fault Coverage Analysis for Switched-Capacitor Systems.

[BibT_eX]

[DOI]

Proceedings of the 1998 Design, 1998

1996

Reducing the impact of DFT on the performance of analog integrated circuits: improved sw-op amp design.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1995

A solution for the on-line test of analog ladder filters.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

1994

A new strategy for testing analog filters.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

A Low-Cost Strategy for Testing Analog Filters.

[BibT_eX]

[DOI]

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

1993

Testable switched-capacitor filters.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, July, 1993

Improving the testability of switched-capacitor filters.

[BibT_eX]

[DOI]

J. Electron. Test., 1993

1992

On-line testing of switched-capacitor filters.

[BibT_eX]

[DOI]