Dianwei Hu

According to our database, Dianwei Hu authored at least 3 papers between 2007 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture.

Dong Xiang, Dianwei Hu, Qiang Xu, Alex Orailoglu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

2007

Pattern-directed circuit virtual partitioning for test power reduction.

Qiang Xu, Dianwei Hu, Dong Xiang

Proceedings of the 2007 IEEE International Test Conference, 2007

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost.

Dong Xiang, Krishnendu Chakrabarty, Dianwei Hu, Hideo Fujiwara

Proceedings of the 16th Asian Test Symposium, 2007