Dhanoop Varghese

According to our database, Dhanoop Varghese authored at least 9 papers between 2004 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.

Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.

Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.

Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture.

Davide Cornigli, Susanna Reggiani, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, Davide Fabiani, Dhanoop Varghese, Enis Tuncer, S. Krishnan, Luu Nguyen

Microelectron. Reliab., 2018

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2014

OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.

Dhanoop Varghese, V. Reddy, S. Krishnan, Muhammad Ashraful Alam

Microelectron. Reliab., 2014

TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions.

Federico Monti, Susanna Reggiani, Gaetano Barone, Elena Gnani, Antonio Gnudi, Giorgio Baccarani, Stefano Poli, Ming-Yeh Chuang, Weidong Tian, Dhanoop Varghese, Rick Wise

Proceedings of the 44th European Solid State Device Research Conference, 2014

2007

A comprehensive model for PMOS NBTI degradation: Recent progress.

Muhammad Ashraful Alam, Haldun Kufluoglu, Dhanoop Varghese, S. Mahapatra

Microelectron. Reliab., 2007

2004

Improved Approach for Noise Propagation to Identify Functional Noise Violations.

Sachin Shrivastava, Dhanoop Varghese, Vikas Narang, N. V. Arvind

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004