Der-Cheng Huang

According to our database, Der-Cheng Huang authored at least 11 papers between 1999 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

OWL-L: An OWL-based language for Web resources links.

I-Ching Hsu, Yuan Kwei Tzeng, Der-Cheng Huang

Comput. Stand. Interfaces, 2009

2004

A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays.

Vikram Arora, Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das

IEEE Trans. Instrum. Meas., 2004

2003

An efficient BIST method for non-traditional faults of embedded memory arrays.

Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das

IEEE Trans. Instrum. Meas., 2003

2002

An efficient BIST method for distributed small buffers.

Wen-Ben Jone, Der-Cheng Huang, S. C. Wu, Kuen-Jong Lee

IEEE Trans. Very Large Scale Integr. Syst., 2002

A parallel transparent BIST method for embedded memory arrays bytolerating redundant operations.

Der-Cheng Huang, Wen-Ben Jone

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

A parallel built-in self-diagnostic method for embedded memoryarrays.

Der-Cheng Huang, Wen-Ben Jone

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

2001

Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis.

Wen-Ben Jone, Der-Cheng Huang, Shih-Chieh Chang, Sunil R. Das

VLSI Design, 2001

A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers.

Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers.

Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

2000

An efficient parallel transparent diagnostic BIST.

Der-Cheng Huang, Wen-Ben Jone

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999

An Efficient BIST Method for Small Buffers.

Wen-Ben Jone, Der-Cheng Huang, S. C. Wu, Kuen-Jong Lee

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999