Dennis R. Ball

According to our database, Dennis R. Ball authored at least 11 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node.

Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET.

Balaji Narasimham, A-R. Montoya, C. Paone, T. Riehle, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages.

Jenna B. Kronenberg, Yoni Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology.

Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.

Sajal Islam, Aditha S. Senarath, Arijit Sengupta, En-xia Zhang, Dennis R. Ball, Daniel M. Fleetwood, Ronald D. Schrimpf, Esmat Farzana, Arkka Bhattacharyya, Nolan S. Hendricks, James S. Speck

Proceedings of the Device Research Conference, 2023

2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Single-Event Latchup Vulnerability at the 7-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET.

Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

High-Current State triggered by Operating-Frequency Change.

Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2015

Multi-cell soft errors at the 16-nm FinFET technology node.

N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, Dennis R. Ball, Michael W. McCurdy, Michael L. Alles, Indranil Chatterjee

Proceedings of the IEEE International Reliability Physics Symposium, 2015