Delgermaa Nergui

According to our database, Delgermaa Nergui authored at least 3 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs.

Delgermaa Nergui, M. Hosseinzadeh, Y. A. Mensah, H. P. Lee, D. G. Sam, K. Li, E. X. Zhang, Daniel M. Fleetwood, John D. Cressler

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures.

Harrison P. Lee, Delgermaa Nergui, Jeffrey W. Teng, Jackson P. Moody, Nelson Sepúlveda-Ramos, John D. Cressler

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs.

Harrison P. Lee, Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Jackson P. Moody, Delgermaa Nergui, Brett L. Ringel, Zachary R. Brumbach, Alizeh Premani, Uppili S. Raghunathan, Vibhor Jain, John D. Cressler

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023