Degang Chen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017

Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2017

Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2017

Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2017

Efficient Verification Against Undesired Operating Points for MOS Analog Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2017

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.

[BibT_eX]

[DOI]

J. Electron. Test., 2017

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.

[BibT_eX]

[DOI]

J. Electron. Test., 2017

Accurate jitter decomposition in high-speed links.

[BibT_eX]

[DOI]

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.

[BibT_eX]

[DOI]

Shravan K. Chaganti

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Technique for generating timing skew resistant time-interleaved signals.

[BibT_eX]

[DOI]

Qianqian Wang

Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Practical linear and quadratic gradient errors suppression techniques in string DACs.

[BibT_eX]

[DOI]

Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Systematic and random mismatch characterization in device arrays.

[BibT_eX]

[DOI]

Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Accurate and robust spectral testing with relaxed instrumentation requirements.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2017

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2017

An on-chip ADC BIST solution and the BIST enabled calibration scheme.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2017

Accurate spectral testing of the signals with amplitude drift.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2016

Accurate Spectral Testing With Impure Source and Noncoherent Sampling.

[BibT_eX]

[DOI]

Benjamin Magstadt

IEEE Trans. Instrum. Meas., 2016

New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2016

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.

[BibT_eX]

[DOI]

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Accurate spectral testing with non-coherent sampling for large distortion to noise ratios.

[BibT_eX]

[DOI]

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Low cost ultra-pure sine wave generation with self calibration.

[BibT_eX]

[DOI]

Akhilesh Kesavan Unnithan

Proceedings of the 2016 IEEE International Test Conference, 2016

New strategies in removing non-coherency from signals with large distortion to noise ratios.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Toward complete analog fault coverage with minimal observation points using a fault propagation graph.

[BibT_eX]

[DOI]

Shravan K. Chaganti

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Low-cost dithering generator for accurate ADC linearity test.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2015

A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods.

[BibT_eX]

[DOI]

IEEE Des. Test, 2015

A low cost jitter separation and characterization method.

[BibT_eX]

[DOI]

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Ultrafast stimulus error removal algorithm for ADC linearity test.

[BibT_eX]

[DOI]

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Effect of flicker noise on SEIR for accurate ADC linearity testing.

[BibT_eX]

[DOI]

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A simple ramp generator with level spreading for SEIR based ADC BIST circuit.

[BibT_eX]

[DOI]

Hao Meng

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

Switched-compensation technique in switched-capacitor circuit for achieving fast settling performance.

[BibT_eX]

[DOI]

Jiaming Liu

Hao Meng

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A hardware Trojan embedded in the Inverse Widlar reference generator.

[BibT_eX]

[DOI]

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A slew-rate enhancement technique for fully differential amplifier without inducing Trojan state.

[BibT_eX]

[DOI]

Chongli Cai

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter.

[BibT_eX]

[DOI]

Xu Zhang

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A low cost jitter estimation and ADC spectral testing method.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Accurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Direct temperature to digital converters with low supply sensitivity for power/thermal management.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A programmable temperature trigger circuit.

[BibT_eX]

[DOI]

Qianqian Wang

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A novel 20-bit R-2R DAC structure based on ordered element matching.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Performance enhancement induced Trojan states in op-amps, their detection and removal.

[BibT_eX]

[DOI]

Chongli Cai

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014

Efficient Spectral Testing With Clipped and Noncoherently Sampled Data.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2014

Accurate and efficient method of jitter and noise separation and its application to ADC testing.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Auto-identification of positive feedback loops in multi-state vulnerable circuits.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators.

[BibT_eX]

[DOI]

Qianqian Wang

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference.

[BibT_eX]

[DOI]

Yen-Ting Wang

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A simple slew rate enhancement technique with improved linearity and preserved small signal performance.

[BibT_eX]

[DOI]

Bin Huang

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

An effective conductance cancellation method with minimal design effort.

[BibT_eX]

[DOI]

Bin Huang

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Test Conference, 2014

Identification and break of positive feedback loops in Trojan States Vulnerable Circuits.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

Efficient analog verification against Trojan states using divide and contraction method.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

A high gain operational amplifier via an efficient conductance cancellation technique.

[BibT_eX]

[DOI]

Bin Huang

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013

FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2013

An Order-Statistics Based Matching Strategy for Circuit Components in Data Converters.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique.

[BibT_eX]

[DOI]

Bharath Karthik Vasan

IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Effectiveness of circuit-level continuation methods for Trojan State Elimination verification.

[BibT_eX]

[DOI]

Yen-Ting Wang

Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Practical methods for verifying removal of Trojan stable operating points.

[BibT_eX]

[DOI]

Yen-Ting Wang

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

High resolution ADC spectral test with known impure source and non-coherent sampling.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Reliability degradation with electrical, thermal and thermal gradient stress in interconnects.

[BibT_eX]

[DOI]

Srijita Patra

Randy Geiger

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

A high resolution and high accuracy R-2R DAC based on ordered element matching.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

ADC spectral testing allowing amplitude clipping.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

A 15-bit binary-weighted current-steering DAC with ordered element matching.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals.

[BibT_eX]

[DOI]

Guican Chen

IEEE Trans. Instrum. Meas., 2012

Testing ADC Spectral Performance Without Dedicated Data Acquisition.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2012

ADC jitter estimation using a single frequency test without requiring coherent sampling.

[BibT_eX]

[DOI]

Guican Chen

IEICE Electron. Express, 2012

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

On Chip Signal Generators for Low Overhead ADC BIST.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

Performance verification of start-up circuits in reference generators.

[BibT_eX]

[DOI]

Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

A method for accurate full spectrum testing without requiring coherency.

[BibT_eX]

[DOI]

Randy Geiger

Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications.

[BibT_eX]

[DOI]

Yulong Shi

Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Reliability modeling of metal interconnects with time-dependent electrical and thermal stress.

[BibT_eX]

[DOI]

Srijita Patra

Randy Geiger

Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Algorithm for dramatically improved efficiency in ADC linearity test.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Test Conference, 2012

A compact low-power supply-insensitive CMOS current reference.

[BibT_eX]

[DOI]

Chen Zhao

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Sinusoidal signal generation for production testing and BIST applications.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

A low cost method for testing offset and gain error for ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2011

A novel robust and accurate spectral testing method for non-coherent sampling.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2011

Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

SNR measurement based on linearity test for ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

2010

A new method for estimating spectral performance of ADC from INL.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

Output impedance linearization technique for current-steering DACs.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

New calibration technique for current-steering DACs.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Linearity testing of ADCs using low linearity stimulus and Kalman filtering.

[BibT_eX]

[DOI]

Bharath K. Vasan

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators.

[BibT_eX]

[DOI]

Jun He

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

INL based dynamic performance estimation for ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Phase control of triangular stimulus generator for ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2009

High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2009

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2009

Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

Optimal Area and Impedance Allocation for Dual-string DACs.

[BibT_eX]

[DOI]

Thu T. Duong

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Cost Effective Signal Generators for ADC BIST.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Signal generators for cost effective BIST of ADCs.

[BibT_eX]

[DOI]

Proceedings of the 19th European Conference on Circuit Theory and Design, 2009

2008

Testing of Precision DAC Using Low-Resolution ADC With Wobbling.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2008

System identification -based reduced-code testing for pipeline ADCs' linearity test.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

Adjustable hysteresis CMOS Schmitt triggers.

[BibT_eX]

[DOI]

Vipul Katyal

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

A simple and accurate method to predict offset voltage in dynamic comparators.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering.

[BibT_eX]

[DOI]

Hanqing Xing

Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008

An overview and behavioral modeling of higher order multi-bit SigmaDelta A/D converters.

[BibT_eX]

[DOI]

Vaibhav Kumar

Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008

2007

SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2007

Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2007

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

A fully digital-compatible BIST strategy for ADC linearity testing.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

Deterministic DEM DAC Performance Analysis.

[BibT_eX]

[DOI]

Hanjun Jiang

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006

A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2006

Output tracking control of a one-link flexible manipulator via causal inversion.

[BibT_eX]

[DOI]

IEEE Trans. Control. Syst. Technol., 2006

Yield enhancement with optimal area allocation for ratio-critical analog circuits.

[BibT_eX]

[DOI]

Yu Lin

IEEE Trans. Circuits Syst. I Regul. Pap., 2006

Testing of Precision DACs Using Low-Resolution ADCs with Dithering.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

Characterization of a current-mode bandgap circuit structure for high-precision reference applications.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs.

[BibT_eX]

[DOI]

Hanqing Xing

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Explicit characterization of bandgap references.

[BibT_eX]

[DOI]

Xin Dai

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs.

[BibT_eX]

[DOI]

Vipul Katyal

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems 2006, 2006

2005

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.

[BibT_eX]

[DOI]

Turker Kuyel

IEEE Trans. Instrum. Meas., 2005

A 16-bit resistor string DAC with full-calibration at final test.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

High-performance ADC linearity test using low-precision signals in non-stationary environments.

[BibT_eX]

[DOI]

Turker Kuyel

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Pipeline ADC linearity testing with dramatically reduced data capture time.

[BibT_eX]

[DOI]

Ioannis Papantonopoulos

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A two-step DDEM ADC for accurate and cost-effective DAC testing.

[BibT_eX]

[DOI]

Hanqing Xing

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A test strategy for time-to-digital converters using dynamic element matching and dithering.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs.

[BibT_eX]

[DOI]

Hanjun Jiang

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

An Nth order central symmetrical layout pattern for nonlinear gradients cancellation.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs.

[BibT_eX]

[DOI]

Xin Dai

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

An adaptive, truly background calibration method for high speed pipeline ADC design.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004

A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

The SRE/SRM approach for spectral testing of AMS circuits.

[BibT_eX]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems.

[BibT_eX]

Robert Weber

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Testing high resolution ADCs using deterministic dynamic element matching.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals.

[BibT_eX]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient.

[BibT_eX]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Robust design of high gain amplifiers using dynamical systems and bifurcation theory.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Optimum area allocation for resistors and capacitors in continuous-time monolithic filters.

[BibT_eX]

Haibo Fei

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

BIST and production testing of ADCs using imprecise stimulus.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2003

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.

[BibT_eX]

[DOI]

Turker Kuyel

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs.

[BibT_eX]

[DOI]

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.

[BibT_eX]

[DOI]

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

A deterministic dynamic element matching approach to ADC testing.

[BibT_eX]

[DOI]

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS.

[BibT_eX]

[DOI]

Chengming He

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

2001

Causal inversion of nonminimum phase systems.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE Conference on Decision and Control, 2001

Automatic landing control using H∞ control and stable inversion.

[BibT_eX]

[DOI]

Jun Che

Proceedings of the 40th IEEE Conference on Decision and Control, 2001

2000

Adaptive learning control for nonminimum phase systems.

[BibT_eX]

[DOI]

D. J. Chen

Proceedings of the IEEE International Conference on Systems, 2000

1999

Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator.

[BibT_eX]

[DOI]

Ranjan Mukherjee

Gangbing Song

J. Field Robotics, 1999

1998

A finite energy property of stable inversion to nonminimum phase nonlinear systems.

[BibT_eX]

[DOI]

Hongchao Zhao

IEEE Trans. Autom. Control., 1998

1996

Nonlinear inversion-based output tracking.

[BibT_eX]

[DOI]

Santosh Devasia

Brad Paden

IEEE Trans. Autom. Control., 1996

Optimal motion planning for flexible space robots.

[BibT_eX]

[DOI]

Hongchao Zhao

Proceedings of the 1996 IEEE International Conference on Robotics and Automation, 1996

1993

Control of free-flying underactuated space manipulators to equilibrium manifolds.

[BibT_eX]

[DOI]

Ranjan Mukherjee

IEEE Trans. Robotics Autom., 1993

Application of Kharitonov's theorem to mechanical systems.

[BibT_eX]

[DOI]

Tesfay Meressi

Brad E. Paden

IEEE Trans. Autom. Control., 1993

Adaptive linearization of hybrid step motors: stability analysis.

[BibT_eX]

[DOI]