Debesh Bhatta
According to our database1,
Debesh Bhatta
authored at least 13 papers
between 2011 and 2016.
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Timeline
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2016
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Bibliography
2016
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016
2015
Incoherent Undersampling-Based Waveform Reconstruction Using a Time-Domain Zero-Crossing Metric.
IEEE Trans. Very Large Scale Integr. Syst., 2015
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
J. Electron. Test., 2015
Proceedings of the 28th International Conference on VLSI Design, 2015
2014
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling.
J. Electron. Test., 2014
Timing Variation Adaptive Pipeline Design: Using Probabilistic Activity Completion Sensing with Backup Error Resilience.
Proceedings of the 2014 27th International Conference on VLSI Design, 2014
Low cost back end signal processing driven bandwidth interleaved signal acquisition using free running undersampling clocks and mixing signals.
Proceedings of the 2014 International Test Conference, 2014
2013
Proceedings of the International Symposium on Quality Electronic Design, 2013
Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling.
Proceedings of the Design, Automation and Test in Europe, 2013
Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms Using Bandwidth Interleaving.
Proceedings of the 22nd Asian Test Symposium, 2013
2012
Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization.
Proceedings of the 2012 IEEE International Test Conference, 2012
Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving.
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2011
Time Domain Characterization and Test of High Speed Signals Using Incoherent Sub-sampling.
Proceedings of the 20th IEEE Asian Test Symposium, 2011