Debasis Mitra

According to our database, Debasis Mitra authored at least 20 papers between 2006 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2018

Robust In-Field Testing of Digital Microfluidic Biochips.

Sukanta Bhattacharjee, Debasis Mitra, Bhargab B. Bhattacharya

ACM J. Emerg. Technol. Comput. Syst., 2018

2017

Design of Practical Parity Generator and Parity Checker Circuits in QCA.

Dharmendra Kumar, Chintoo Kumar, Shipra Gautam, Debasis Mitra

Proceedings of the IEEE International Symposium on Nanoelectronic and Information Systems, 2017

2016

Design of a practical fault-tolerant adder in QCA.

Dharmendra Kumar, Debasis Mitra

Microelectron. J., 2016

On Fault-Tolerant Design of Exclusive-OR Gates in QCA.

Dharmendra Kumar, Debasis Mitra, Bhargab B. Bhattacharya

CoRR, 2016

2015

Offline Washing Schemes for Residue Removal in Digital Microfluidic Biochips.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

ACM Trans. Design Autom. Electr. Syst., 2015

Certificate-based encoding of gate level description for secure transmission.

Sandip Ghosal, Debasis Mitra, Subhasis Bhattacharjee

Int. J. Electron. Secur. Digit. Forensics, 2015

2014

On-Chip Sample Preparation for Multiple Targets Using Digital Microfluidics.

Debasis Mitra, Sudip Roy, Sukanta Bhattacharjee, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

2013

Signature Embedding in the Functional Description of Reversible Circuit.

Animesh Roy, Debasis Mitra

Proceedings of the Security in Computing and Communications - International Symposium, 2013

2012

Congestion-aware layout design for high-throughput digital microfluidic biochips.

Sudip Roy, Debasis Mitra, Bhargab B. Bhattacharya, Krishnendu Chakrabarty

ACM J. Emerg. Technol. Comput. Syst., 2012

Secure transmission of gate level description.

Sandip Ghosal, Debasis Mitra

Proceedings of the 1st International Conference on Recent Advances in Information Technology, 2012

On-Chip Sample Preparation with Multiple Dilutions Using Digital Microfluidics.

Debasis Mitra, Sudip Roy, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2012

Automated path planning for washing in digital microfluidic biochips.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012

On-Line Error Detection in Digital Microfluidic Biochips.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization Techniques.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

J. Electron. Test., 2011

On residue removal in digital microfluidic biochips.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, 2011

2010

Test pattern generation for droop faults.

Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sandip Kundu, Ashish Nigam, Sandeep K. Dey

IET Comput. Digit. Tech., 2010

Testing of Digital Microfluidic Biochips Using Improved Eulerization Techniques and the Chinese Postman Problem.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Droop sensitivity of stuck-at fault tests.

Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya

IET Comput. Digit. Tech., 2009

2008

Accelerated Functional Testing of Digital Microfluidic Biochips.

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Bhargab B. Bhattacharya, D. Dutta Majumder, Krishnendu Chakrabarty

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2006

Test Pattern Generation for Power Supply Droop Faults.

Debasis Mitra, Subhasis Bhattacharjee, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sujit T. Zachariah, Sandip Kundu

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006