Debashis Nayak

According to our database, Debashis Nayak authored at least 3 papers between 1999 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Improving Precision Using Mixed-level Fault Diagnosis.

M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application.

Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

1999

Simulation-Based Design Error Diagnosis and Correction in Combinational Digital Circuits.

Debashis Nayak, D. M. H. Walker

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999